Impedance spectroscopy study of polycrystalline Bi6Fe2Ti3O18

Impedance/Dielectric Spectroscopy of Electroceramics–Part 1: Evaluation of Composite Models for Polycrystalline Ceramics

In the microcrystalline regime, the electrical (impedance/dielectric) behavior of grain boundarycontrolled electroceramics is well described by the “brick-layer model” (BLM). In the nanocrystalline regime, however, grain boundary layers can represent a significant volume fraction of the overall microstructure. Simple boundary-layer models no longer adequately describe the electrical properties ...

Study the Effect of Silicon Nanowire Length on Characteristics of Silicon Nanowire Based Solar Cells by Using Impedance Spectroscopy

Silicon nanowire (SiNW) arrays were produced by electroless method on polycrystalline Si substrate, in HF/ AgNO3 solution. Although the monocrystalline silicon wafer is commonly utilized as a perfect substrate, polycrystalline silicon as a low cost substrate was used in this work for photovoltaic applications. In order to study the influence of etching time (which affects the SiNWs length) on d...

Optical and Impedance Spectroscopy Study of ZnS Nanoparticles

Zinc Sulphide particle in the nanometer size regime has been synthesized using chemical routes. The particles were capped using 2-mercaptoethanol to achieve the stability and avoid the coalescence. The as-obtained particles were characterized by X-ray diffraction (XRD), Transmission electron microscopy (TEM), UV–VIS absorption and photoluminescence (PL) spectra. The dielectric measurements of t...

Potential and Impedance Imaging of Polycrystalline BiFeO3 Ceramics

Electrostatic-force-sensitive scanning probe microscopy (SPM) is used to investigate grain boundary behavior in polycrystalline BiFeO3 ceramics. Scanning surface potential microscopy (SSPM) of a laterally biased sample exhibits potential drops due to resistive barriers at the grain boundaries. In this technique, the tips acts as a moving voltage probe detecting local variations of potential ass...

Impedance Spectroscopy of Thin Films